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SCI Journals (~2000)

  1. Hexatic ordering in freely suspended liquid crystal films, J. D. Brock, D. Y. Noh, B. R. McClain, J. D. Litster, R. J. Birgeneau, Amnon Aharony, P. M. Horn, Jason C. Liang, Zeitschrift für Physik B Condensed Matter 74(2), 197-213 (1989)


  2. Fluid, Hexatic, and Crystal Phases in Terephathal-bis-(4n)-Alkylanilines, D. Y. Noh, J. D. Brock, J. D. Litster, and R. J. Birgeneau, Phys. Rev. B  40, 49204927 (1989)


  3. Synchrotron x-ray study of dimensional crossover in solid-phase smectic liquid-crystal films, D. Y. Noh, J. D. Brock, J. O. Fossum, J. P. Hill, W. J. Nuttall, J. D. Litster, and R. J. Birgeneau Phys. Rev. B 43, 842850 (1991)


  4. Synchrotron x-ray diffraction study of the disordering of the Ge(111) surface at high temperatures, A. Mak, K. W. Evans-Lutterodt, K. Blum, D. Y. Noh, J. D. Brock, G. A. Held, and R. J. Birgeneau, Phys. Rev. Lett. 66, 20022005 (1991)


  5. Long-range coherence and macroscopic phase separation of steps on vicinal Si(111), D. Y. Noh, K. I. Blum, M. J. Ramstad, and R. J. Birgeneau, Phys. Rev. B 44, 1096910972 (1991)


  6. Faceting, roughness, and step disordering of vicinal Si(111) surfaces: An x-ray-scattering study, D. Y. Noh, K. I. Blum, M. J. Ramstad, and R. J. Birgeneau, Phys. Rev. B 48, 16121625 (1993)


  7. Pinned and unpinned step dynamics on vicinal silver (110) surfaces, G. A. Held, D. M. Goodstein, R. M. Feenstra, M. J. Ramstad, D. Y. Noh, and R. J. Birgeneau, Phys. Rev. B 48, 84588461 (1993)


  8. D.c. Current-Dependent Faceting of Vicinal Si(111), M. J. Ramstad, R. J. Birgeneau, K. I. Blum, D. Y. Noh, B. O. Wells and M. J. Young, Europhys. Lett., 24 (S), pp. 653-658 (1993)


  9. Synchrotron X-ray scattering study of the pressure melting of near-monolayer xenon on single crystal graphite at 140 K, W.J. Nuttall, D.Y. Noh, B.O. Wells and R.J. Birgeneau, Surface Science Volumes 307309, Part B, 768774 (1994)


  10. Thermal roughness of a Si(331) surface, D.Y. Noh, K.S. Lianga, Y. Hwub, S. Chandavarkar, Surface Science 326(12), L455L459 (1995)


  11. X-ray-scattering studies of the interfacial structure of Au/GaAs, D. Y. Noh, Y. Hwu, H. K. Kim, M. Hong, Phys. Rev. B 51, 44414448 (1995)


  12. Hexatic order in thin smectic-F liquid-crystal films, Q. J. Harris, D. Y. Noh, D. A. Turnbull, and R. J. Birgeneau, Phys. Rev. E 51, 57975804 (1995)


  13. Isothermal melting of near-monolayer xenon on single-crystal graphite, W J Nuttall, D Y Noh, B O Wells and R J Birgeneau, Journal of Physics: Condensed Matter


  14. Strain relaxation in Fe3(Al,Si)/GaAs: An x-ray scattering study, D. Y. Noh, Y. Hwu, J. H. Je, M. Hong, and J. P. Mannáerts, Appl. Phys. Lett. 68, 1528 (1996)


  15. Microstructure of diamond and β‐SiC interlayer studied by synchrotron xray scattering, J. H. Je and D. Y. Noh, J. Appl. Phys. 80, 2791 (1996)


  16. Preferred orientation of TiN films studied by a real time synchrotron x-ray scattering, J. H. Je, D. Y. Noh, H. K. Kim, and K. S. Liang, J. Appl. Phys. 81, 6126 (1997)


  17. Epitaxial and island growth of Ag/Si(001) by rf magnetron sputtering, J. H. Je, T. S. Kang, and D. Y. Noh, J. Appl. Phys. 81, 6716 (1997)


  18. Preferred orientation of TiN films studied by a real time synchrotron x-ray scattering, J. H. Je1, D. Y. Noh, H. K. Kim, and K. S. Liang, J. Appl. Phys. 81, 6126 (1997)


  19. Long-range behavior of the layer-by-layer growth in Si/Si(111)-7x7 homoepitaxy, D. Y. Noh, Y. Hwu, K. S. Liang, Phys. Rev. B 56, R7080R7083 (1997)


  20. The tetragonal distortion in thin Pb(Zr,Ti)O3 films grown on MgO(100), H. C. Kang, D. Y. Noh, J. H. Je and H. K. Kim, MRS Proceedings, 493 (1997)


  21. Crystallization of amorphous (Ba,Sr)TiO3/MgO(001) thin films, D. Y. Noh, H. H. Lee, T. S. Kang, and J. H. Je, Appl. Phys. Lett. 72, 2823 (1998)


  22. Evolution of surface morphology during Fe/Si(111) and Fe/Si(001) heteroepitaxy, H. J. Kim, D. Y. Noh, J. H. Je, Y. Hwu, Phys. Rev. B 59, 46504653 (1999)


  23. Amorphous, Silicide, and Crystalline Fe Films Grown on Si(001) by Radio-frequency Magnetron Sputtering, Je. J. H, Kim H. K, Noh. D. Y, J. Mater. Res. 14, 4 (1999)


  24. Microstructures of GaN1xPx layers grown on (0001)GaN substrates by gas source molecular beam epitaxy, Tae-Yeon Seong, In-Tae Bae, Chel-Jong Choi, D. Y. Noh, Y. Zhao, and C. W. Tu, J. Appl. Phys. 85, 3192 (1999)


  25. Microstructure of epitaxial aFe2O3 grains in Baferrite thin films grown on sapphire (001), T. S. Cho, S. J. Doh, J. H. Je, and D. Y. Noh, Appl. Phys. Lett. 74, 2050 (1999)


  26. Nitridation of sapphire substrate and its effect on the growth of GaN layer at low temperature, Jong-Sik Paek, Kyoung-Kook Kim, Ji-Myon Lee, Dong-Joon Kim, Min-Su Yi, Do Young Noh, Hyo-Gun Kim, Seong-Ju Park, Journal of Crystal Growth, 200(12), 5562 (1999)


  27. Synchrotron X-ray Scattering Study of the Strain Evolution in Thin AlN/Sapphire(0001) Films, Hyon Choi Kang, Sun Hee Seo and Do Young Noh, Jpn. J. Appl. Phys. 38 (1999)


  28. Iron-Oxide Interlayer Existing in Ba-Ferrite/Sapphire(001) Films, Tae Sik Cho, Seok Joo Doh, Jung Ho Je and Do Young Noh, Jpn. J. Appl. Phys. 38 (1999)


  29. The development and application of imaging EXAFS spectroscopy, Hwu. Y, Tsai. W. L, Chang. L. W, Chen. C. H, Wu. C. C, Noh. D. Y, Je. J. H, Fecher. G. H, Bertolo. M, Berger. H, Japanese Journal of Applied Physics Part 1-Regular Papers Short Notes & Review Papers, 38, 646-649 (1999)


  30. Thickness dependence of the crystallization of Ba-ferrite films, T. S. Cho, S. J. Doh, J. H. Je, and D. Y. Noh, J. Appl. Phys. 86, 195

    8 (1999)


  31. Coherence-enhanced synchrotron radiology: Refraction versus diffraction mechanisms, Hsieh. H. H, Lu. M. J, Tsai. W. L, Lin. H. M, Goh. W. C, Lai. B, Je. J. H, Kim. C. K, Noh. D. Y, Youn. H. S, Tromba. G, Margaritondo. G, J. Appl. Phys. 86, 4613 (1999)

  32.  

  33. Use of Photoelectron Microscopes as X-ray Detectors for Imaging and Other Applications, Y. Hwu, W.L. Tsai, B. Lai, D.C. Mancini, J.H. Je, D.Y. Noh, H.S. Youn, C.S. Hwang, F. Cerrina, W. Swiech, M. Bertolo, G. Tromba, G. Margaritondo, Nuclear Instruments & Methods in Physics Research Section a-Accelerators Spectrometers Detectors and Associated Equipment, 437(2-3), 516-520 (1999)


  34. Effects of growth temperature on GaN nucleation layers, M. S. Yi, H. H. Lee, D. J. Kim, S. J. Park, D. Y. Noh, C. C. Kim, and J. H. Je, Appl. Phys. Lett. 75, 2187 (1999)


  35. Structure Determination of Nanostructured Ni-Co Films by Anomalous X-ray Scattering, G. M. Chow, W. C. Goh, Y. K. Hwu, T. S. Cho, J. H. Je, H. H. Lee, H. C. Kang, D. Y. Noh, C. K. Lin, and W. D. Chang, Appl. Phys. Lett. 75, 2503 (1999)


  36. Coherence based contrast enhancement in x-ray radiography with a photoelectron microscope, Y. Hwu, B. Lai, D. C. Mancini, J. H. Je, D. Y. Noh, M. Bertolo, G. Tromba, and G. Margaritondo, Appl. Phys. Lett. 75, 2377 (1999)


  37. Crystallization of amorphous precursor of Ba-ferrite film: a real-time synchrotron x-ray scattering study, Seok Joo Doh, Jung Ho Je, Do Young Noh, Tak Jean Moon, IEEE TRANSACTIONS ON MAGNETICS, 35(5), 2778-2780 (1999) 


  38. Optical and Structural Studies of Phase Separation in InGaN Film Grown by MOCVD, Moon. Yong-Tae, Kim. Dong-Joon, Song. Keun-Man, Lee. In-Hwan, Yi. Min-Su, Noh. Do-Young, Choi. Chel-Jong, Seong. Tae-Yeon, Park. Seong-Ju, Physica Status Solidi (B), 216(1), 167-170


  39. Formation of crystalline Ba-ferrite phase from alpha-Fe2O3 phase in amorphous precursor, Tae Sik Cho, Jung Ho Je, and Do Young Noh, Appl. Phys. Lett. 76, 303 (2000)


  40. Structural evolution of GaN during initial stage MOCVD growth, Chong Cook Kim, Jung Ho Je, Min-Su Yi and Do Young Noh, MRS Proceedings 595 (1999)


  41. Effect of growth interruption and the introduction of H2 on the growth of InGaN/GaN multiple quantum wells, Yong-Tae Moon, Dong-Joon Kim, Keun-Man Song, Dong-Wan Kim, Min-Su Yi, Do-Young Noh, and Seong-Ju Park, J. Vac. Sci. Technol. B, 18, 2631 (2000)

 

XLNP Department of Physics and Photon Science , GIST , 123 Cheomdan-gwagiro(Oryong-dong), Buk-ku, Gwangju, 500-712 Republic of Korea Tel : +82-062-715-2352 Dasan building 606

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