You cannot see this page without javascript.

Skip to content

SCI Journals (2001~2010)

  1. Observation of dynamic coupling between the Q1 and Q2 charge-density waves in NbSe3, Y. Li, D. Y. Noh*, J. H. Price, K. L. Ringland, J. D. Brock, S. G. Lemay, K. Cicak, R. E. Thorne and Mark Sutton, Phys. Rev. B 63, 041103(R) (2001)

  2. Characteristics of Y2O3 films on Si(111) grown by oxygen-ion beam-assisted deposition, M.-H. Cho, D.-H. Ko, J.G. Seo, S.W. Whangbo, K. Jeong, I.W. Lyo, C.N. Whang, D.Y. Noh, H.J. Kim, Thin Solid Films 382, 288 (2001)

  3.  Thickness dependence of Y2O3 films grown on an oxidized Si surface, M.-H. Cho1, D.-H. Ko, Y. K. Choi, I. W. Lyo, K. Jeong, C. N. Whang, H. J. Kim, and D. Y. Noh, J. Vac. Sci. Technol. A 19, 200 (2001)

  4. Structural and electrical characteristics of Y2O3 films grown on oxidized Si(100) surface, M.-H. Cho, D.-H. Ko, Y. G. Choi, K. Jeong, I. W. Lyo, D. Y. Noh, H. J. Kim, and C. N. Whang, J. Vac. Sci. Technol. A 19, 192 (2001)

  5. High-temperature structural behavior of Ni/Au Contact on GaN(0001), Chong Cook Kim, Jong Kyu Kim, Jong-Lam Lee, Jung Ho Je, Min-Su Yi, Do Young Noh, Y.Hwu and P. Ruterana, MRS Internet J. Nitride Semicond. Res. 6, 4 (2001)

  6. Strain relaxation of GaN nucleation layers during rapid thermal annealing, M. S. Yi and D. Y. Noh, Appl. Phys. Lett. 78, 2443 (2001)

  7. X-ray scattering study on the structural evolution of AlN/sapphire(0001) films during radiofrequency sputter growth, H. C. Kang, S. H. Seo and D. Y. Noh, Journal of Materials Research. 16, 1814 (2001)

  8. Catalytic role of Au in Ni/Au contact on GaN(0001), C. C. Kim, J. K. Kim, J.-L. Lee, J. H. Je, M. S. Yi, D. Y. Noh, Y. Hwu, and P. Ruterana, Appl. Phys. Lett. 78, 3773 (2001)

  9. Microstructure of GaN nucleation layer during initial stage MOCVD growth, C.C. Kim, J.H. Je, M.S. Yi, D.Y. Noh, F. Degave, Pierre Ruterana, Materials Science and Engineering: B 82, 108 (2001)

  10. In-plane tensile-strained interfacial structure in a GaN nucleation layer on sapphire(0001), C. C. Kim, J. H. Je, M. S. Yi, D. Y. Noh, and P. Ruterana, J. Appl. Phys. 90, 2191 (2001)

  11. Effects of step-graded AlxGa1xN interlayer on properties of GaN grown on Si(111) using ultrahigh vacuum chemical vapor deposition, Min-Ho Kim, Young-Gu Do, Hyon Chol Kang, Do Young Noh, and Seong-Ju Park, Appl. Phys. Lett. 79, 2713 (2001)

  12. Au Catalyzed Structural and Electrical Evolution of Ni/Au Contact to GaN, C. C. Kim, J. K. Kim, J.-L. Lee, J. H. Je, M. S. Yi, D. Y. Noh, Y. Hwu, and P. Ruterana, physical status solidi (a), 188, 379 (2001)

  13. Structural Effects of Ti Underlayer on CoCrPt Magnetic Films, Sun, C.J.; Chow, G.M.; Soo, E.W.; Wang, J.P.; Hwu, Y.K.; Cho, T.S.; Je, J.H.; Lee, H.H.; Kim, J.W.; Noh, D.Y., Journal of Nanoscience and Nanotechnology, 1, 271 (2001)

  14. Periodic oxide breakdown during oxidation of AlN/Sapphire(0001) films, H. C. Kang, S. H. Seo, J. W. Kim, and D. Y. Noh, Appl. Phys. Lett. 80, 1364 (2002)

  15. Structural study of CoCrPt films by anomalous x-ray scattering and extended x-ray absorption fine structure, G. M. Chow, C. J. Sun1 E. W. Soo, J. P. Wang, H. H. Lee, D. Y. Noh, T. S. Cho, J. H. Je, and Y. K. Hwu, Appl. Phys. Lett. 80, 1607 (2002)

  16. Long-range order and short-range order study on CoCrPt/Ti films by synchrotron x-ray scattering and extended x-ray absorption fine structure spectroscopy, C. J. Sun, G. M. Chow, J. P. Wang, E. W. Soo, Y. K. Hwu, J. H. Je, T. S. Cho, H. H. Lee, and D. Y. Noh, J. Appl. Phys. 91, 7182 (2002)

  17. Microstructures of GaN islands on a stepped sapphire surface, C. C. Kim, J. H. Je, P. Ruterana, F. Degave, G. Nouet, M. S. Yi, D. Y. Noh, and Y. Hwu, J. Appl. Phys. 91, 4233 (2002)

  18. Annealing effects of aluminum silicate films grown on Si(100), M.-H. Cho, Y. S. Rho, H.-J. Choi, S. W. Nam, D.-H. Ko, J. H. Ku, H. C. Kang, D. Y. Noh, C. N. Whang, and K. Jeong, J. Vac. Sci. Technol. A 20, 865 (2002)

  19. Synchrotron X-Ray Scattering Study of the Substrate Effects on Relaxor Pb(Mg1/3Nb2/3-δ)O3/SrTiO3 Thin Films, Seon Hee Seo, Hyon Chol Kang, Yutaka Yamada, Kiyotaka Wasa and Do Young Noh, Jpn. J. Appl. Phys. 41, 6773 (2002)

  20. Ion-induced pattern formation on Co surfaces: An x-ray scattering and kinetic Monte Carlo study, O. Malis, J. D. Brock, R. L. Headrick, Min-Su Yi, J. M. Pomeroy, Phys. Rev. B 66, 035408 (2002)

  21. Structural study of a commensurate phase at Co/Si(111) interface using in situ surface x-ray scattering, T. S. Kang, J. H. Je, H. J. Kim, D. Y. Noh, N. D. Kim, and J. W. Chung, Appl. Phys. Lett. 81, 2776 (2002)

  22. Determination of absolute indium content in InGaN/GaN multiple quantum wells using anomalous x-ray scattering, H. H. Lee, M. S. Yi, H. W. Jang, Y.-T. Moon, S.-J. Park, D. Y. Noh, M. Tang, and K. S. Liang, Appl. Phys. Lett. 81, 5120 (2002)

  23. Investigation of the melting behavior of the alternating PEO/PCL multiblock copolymer by SAXS and WAXS, Tae Chul Kim, Jong Ho Kim, Hyun Hwi Lee, You Han Bae and Do Young Noh, MRS Proceedings , Volume 711 (2001)

  24. A structural study of effects of NiP seed layer on the magnetic properties of CoCrPt/Ti/NiP perpendicular magnetic films, C.J. Sun, G.M. Chow, J.P. Wang, E.W. Soo, D.Y. Noh, J.H. Je, Y.K. Hwu, Nucl. Instrum. Methods Phys. Rev. B 199 , 156 (2003)

  25. Growth-Temperature Dependent Property of GaN Barrier Layer and Its Effect on InGaN/GaN Multiple Quantum Well Light-Emitting Diodes, Yong-Tae Moon, Hyun Hwi Lee, Young Do, Seong-Ju Noh, Park, Dong-Joon Kim, Jin-Sub Park, Jeong-Tak Oh, Nucl. Instr. Meth. B, V. 199, 156-160, (2003)

  26. Effects of pressure and NH3 flow on two-dimensional electron mobility in AlGaN/GaN heterostructures, Yong-Tae Moon, Min-Su Yi, Do-Young Noh and Seong-Ju Park, Journal of the Korean Physical Society, Vol. 42, No. 5, May 2003, pp. 691695

  27. Structural characterization of InGaN thin films and multiple quantum wells: an approach of combining various X-ray scattering methods, H H Lee, H W Jang, D H Kim, D Y Noh, M S Yi, M Tang, K S Liang, Physica B: Condensed Matter, 336, 109 (2003)

  28. X-ray scattering studies on InGaAs quantum dots, C.-H Hsu, H.-Y Lee, Y.-W Hsieh, Y.P Stetsko, M.-T Tang, K.S Lianga, .T Yeh, J.-I Chyi, D.Y Noh, Physica B: Condensed Matter, 336, 98 (2003)

  29. Crossover of the preferred growth orientation of AlN/Si(001) films during off-axis radio frequency sputter growth, H. W. Jang, H. C. Kang, D. Y. Noh, and M. S. Yi, J. Appl. Phys. 94, 2957 (2003)

  30. Synthesis of epitaxial alpha-Al2O3 thin films by thermal oxidation of AlN/sapphire(0001) thin films, Appl. Phys. A 77, 627 (2003)

  31. Two stage oxidation in epitaxial Ni (111)/GaN (0001) thin films, H. C. Kang, S. H. Seo, H. W. Jang, D. H. Kim, and D. Y. Noh, Appl. Phys. Lett. 83, 2139 (2003)

  32. Growth of crack-free high-quality GaN on Si(111) using a low-temperature AlN interlayer: observation of tilted domain structures in the AlN interlayer, Min-Ho Kim, Young-Gu Do, Hyon Chol Kang, Chel-Jong Choi, Do Young Noh, Tae-Yeon Seong, and Seong-Ju Park, Special Issue: 5th International Conference on Nitride Semiconductors (ICNS-5), Volume 0, Issue 7, pages 21502153, December 2003

  33. Structure and Dielectric Properties of Heteroepitaxial PMNT Thin films Integrated Ferroelectrics, K. Wasa, I. Kanno, S. H. Seo, D. Y. Noh, H. Okino & T. Yamamoto, Integrated Ferroelectrics: An International Journal Volume 55, Issue 1 (2003)

  34. Antiphase-type planar defects in Pb(Mg1/3Nb2/3−δ)O3/SrTiO3 thin films, S. H. Seo, H. C. Kang, D. Y. Noh, Y. Yamada, and K. Wasa, Appl. Phys. Lett. 84, 3133 (2004)

  35. Structural properties of a thallium -induced Si(111)- (1x1), N. D. Kim, C. G. Hwang, J. W. Chung, T. C. Kim, H. J. Kim, and D. Y. Noh, Phys. Rev. B, 69, 195311, 2004

  36. Epitaxial Si/Si(001) thin films obtained by solid phase crystallization, H. J. Kim, S. H. Jeon, T. Y. Jeon, and D. Y. Noh, J. Vac. Sci. Technol. A 22, 1188 (2004)

  37. Kinetic Roughening of Ion-Sputtered Pd(001) Surface: Beyond the Kuramoto-Sivashinsky Model, T. C. Kim, C.-M. Ghim, H. J. Kim, D. H. Kim, D. Y. Noh, N. D. Kim, J. W. Chung, J. S. Yang, Y. J. Chang, T. W. Noh, B. Kahng, and J.-S. Kim, Phys. Rev. Lett. 92. 246104 (2004)

  38. Interfacial diffusion in Fe/Cr multilayers studied by synchrotron X-ray techniques, Cho, Tae Sik; Yi, Min Su; Doh, Seok Joo; Je, Jung Ho; Noh, Do Young, Physica Status Solidi (B), Applied Research, vol. 241, Issue 7, pp.1748-1751

  39. Growth pressure dependence of residual strain and threading dislocations in the GaN layer, Sung-Nam Lee, J. K. Son, H. S. Paek, T. Sakong, W. Lee, K. H. Kim, S. S. Kim, Y. J. Lee, D. Y. Noh, E. Yoon, O. H. Nam, Y. Park, Special Issue: The 5th International Symposium on Blue Laser and Light Emitting Diodes (ISBLLED-2004), Volume 1, Issue 10, pages 24582461, September 2004

  40. Chemical depth profile of passive oxide on stainless steel, D. H. Kim, H. H. Lee, S. S. Kim, H. C. Kang, D. Y. Noh, H. Kim, and S. K. Sinha, Appl. Phys. Lett. 85, 6427 (2004)

  41. Oxidation Kinetics in Iron and Stainless Steel: An in Situ X-ray Reflectivity Study, D. H. Kim, S. S. Kim, H. H. Lee, H. W. Jang, J. W. Kim, M. Tang, K. S. Liang, S. K. Sinha, and D. Y. Noh, J. Phys. Chem. B, 2004, 108 (52), pp 2021320218

  42.  Effects of oxygen incorporation in tensile La0.84Sr0.16MnO3−δ thin films during ex situ annealing, S. H. Seo, H. C. Kang, H. W. Jang, and D. Y. Noh, Phys. Rev. B 71, 012412 (2005)

  43. Surface X-Ray Scattering: Shape and Structure of Low-dimensional Objects, K. S. Liang , Yu. P. Stetsko , C. -h. Hsu , Y. Hwu , D. Y. Noh, Chinese Journal Of Physics 43 (1): 219-232 Part, Feb (2005)

  44. Combined study of X-ray reflectivity and atomic force microscopy on a surface-grafted phospholipid monolayer on a solid., Kim K, Byun Y, Kim C, Kim TC, Noh DY, Shin K., J Colloid Interface Sci. 2005 Apr 1;284(1):107-13

  45.  Kinetic roughening of ion-sputtered Pd(001) surface: beyond the Kuramoto-Sivashinsky model, Kim TC, Ghim CM, Kim HJ, Kim DH, Noh DY, Kim ND, Chung JW, Yang JS, Chang YJ, Noh TW, Kahng B, Kim JS, Phys Rev Lett. 2004 Jun 18;92(24):246104. Epub 2004 Jun 17

  46. Effect of thermal damage on optical and structural properties of In0.08Ga0.92N/In0.02Ga0.98N multi-quantum wells grown by MOCVD, Sung-Nam Lee, JoongKon Son, Hosun Paek, Tan Sakong, Wonseok Lee, Kihong Kim, Euijoon Yoon, Jiyoung Kim, Yong-Hoon Cho, YoonJae Lee, SangSoo Kim, DoYoung Noh, Okhyun Nam, Yongjo Park, Journal of Crystal Growth. 275. 5

  47. Structure and Ferroelectric Properties of Single Crystal PMNT Thin Films, K. Wasa, I. Kanno, T. Suzuki, S. H. Seo, D. Y. Noh, H. Okino & T. Yamamoto, Integrated Ferroelectrics: An International Journal, Volume 70, Issue 1 (2005)

  48. Formation of thallium islands on the Si (111) -7×7surface, Kim, N. D.; Hwang, C. G.; Chung, J. W.; Kim, T. C.; Noh, D. Y., Physical Review B, vol. 72, Issue 3

  49. Interfacial structure of oxidized AlN(0002)Si(111) thin film, H. C. Kang and D. Y. Noh, J. Appl. Phys. 98, 044908 (2005)

  50. Use of an indium zinc oxide interlayer for forming Ag-based Ohmic contacts to p-type GaN for UV-light-emitting diodes, Keun-Yong Ban, Hyun-Gi Hon, Do Young Noh, Tae-Yeon Seong, June-O Song and Donghwan Kim, 2005 Semicond. Sci. Technol. 20 921

  51. Anomalous x-ray scattering for structural and chemical analysis of thin films, Do Young Noh, Keng. S. Liang, Journal of Taiwan Vacuum Society, vol.18, (2005)

  52. Morphological evolution of ion-sputtered Pd(001): Temperature effects, T. C. Kim, M. H. Jo, Y. Kim, and D. Y. Noh, Phys. Rev. B 73, 125425 (2006)

  53. Electromechanical coupling factors of single-domain 0.67Pb(Mg1/3Nb2/3)O30.33PbTiO3 single-crystal thin films, K. Wasa, S. Ito, K. Nakamura, T. Matsunaga, I. Kanno, T. Suzuki, H. Okino, T. Yamamoto, S. H. Seo, and D. Y. Noh, Appl. Phys. Lett. 88, 122903 (2006)

  54. Characterization of Molecular Linkages Places between Zeolite Microcrystal Monolayers and a Substrate with X-ray Reflectivity, Heeju Lee ,Jin Seon Park ,Hyunjung Kim , Kyung Byung Yoon , Oliver H. Seeck , Do Hyung Kim , Sun Hee Seo , Hyun Chul Kang , and Do Young Noh, Langmuir, 2006, 22 (6), pp 25982604

  55. Effects of strain and interface roughness between an AlN buffer layer and a ZnO film grown by using radio-frequency magnetron sputtering, M S Yi, T S Cho, J W Jeung, S.-W Kim, J M Lee, J Y Oh, S J Park, D Y Noh ,J. Korean Phys.Soc. 48,1302

  56. X-ray photochemical wet etching of n-Si (100) in hydrofluoric solution, I. H. Cho, D. H. Kim, and D. Y. Noh , Appl. Phys. Lett. 89, 054104 (2006)

  57. Ir/Ag reflector for high-performance GaN-based near UV light emitting diodes, Keun-Yong Bana, Hyun-Gi Honga, Do-Young Noha, Jung Inn Sohnb, Dae-Joon Kangc, Tae-Yeon Seongd, Materials Science and Engineering: B, Volume 133, Issues 13, 25 August 2006, Pages 2629

  58. Sapphire orientation dependence of the microstructure of ZnO thin film during annealing, Tae Sik Cho, Min-Su Yi, Ji Wook Jeung, Do Young Noh, Jin Woo Kim, Jung Ho Je , Journal of Electroceramics December 2006, Volume 17, Issue 2-4, pp 231-234


  60. Phase retrieval from diffraction data utilizing pre-determined partial information, S.S. Kim, S. Marathe, S.N. Kim, H.C. Kang, D.Y. Noh, Thin Solid Films, Volume 515, Issue 14, 23 May 2007, Pages 55685573

  61. High-Q X-ray scattering studyy of InxGa1-xN/GaN multi-quantum wells, Lee YJ, Kim SS, Lee SP, Noh DY, Lee HH, Thin Solid Films, Vol.515, No.14, 5641-5644, 2007 

  62.  Photochemical wet etching of silicon by synchrotron white X-ray radiation, I.H. Cho, D.H. Kim, S.B. Ha, D.Y. Noh, Thin Solid Films, Volume 515, Issue 14, 23 May 2007, Pages 57365740

  63. Thickness Dependence of the Crystallization of α-Fe2O3/α-Al2O3(0001) Thin Films Grown by Sputtering, Tae Sik Cho, Min Su Yi, Do Young Noh, Seok Joo Doh, Jung Ho Je, Solid State Phenomena (Volumes 124 - 126) 

  64. X-ray scattering studies of molecular linkages in Zeolite microcrystal monolayers, Lee, H.; Park, J.; Yoon, K.; Kim, D.; Seo, S.; Kang, H.; Noh, D.; Kim, H., Thin Solid Films, vol. 515, issue 14, pp. 5678-5682

  65. Enhancement of thermal stability of Ta/Si(100) film by a TaSi interlayer, D. C. Ahn, H. H. Lee, S. S. Kim, T. C. Kim, D. Y. Noh, and D. H. Kim, J. Vac. Sci. Technol. A 25, 532 (2007)

  66. Quantum efficiency of double activated Tb3Al5O12:Ce3+, Eu3+, Nazarov, Mihail; Young Noh, Do; Sohn, Jongrak; Yoon, Chulsoo, Journal of Solid State Chemistry, Volume 180, Issue 9, p. 2493-2499.

  67. Connected Au network in annealed Ni/Au thin films on p-GaN, S. P. Lee, H. W. Jang, D. Y. Noh, and H. C. Kang, Appl. Phys. Lett. 91, 201905 (2007)

  68. Kinetic stabilization of Fe film on GaAs(100): An in situ x-ray reflectivity Study, T.C. Kim, J.-M. Lee, Y. Kim, D.Y. Noh, S.-J. OH, J.-S. Kim, Materials Science ,

  69. Structural and luminescent properties of calcium, strontium and barium thiogallates, Mihail Nazarov, Do Young Noh, Hyojung Kim, Materials Chemistry and Physics, Volume 107, Issues 23, 15 February 2008, Pages 456464

  70. Atomic structure of a thallium nanodot lattice formed on the Si(111)-7×7 surface, Kim, N.D.; Hwang, C.G.; Chung, J.W. ; Kim, Y.; Kim, T.C.; Noh, D.Y.; Sumitani, K.; Tajiri, H.; Sakata, O. Surface Science, Volume 602, issue 1 (January 1, 2008), p. 369-374.

  71. X-ray scattering for the atomic structure of a barium-induced Si(111)-3 × 2 surface, N.D. Kim, T.S. Kang, J.H. Je, H.J. Kim, D.Y. Noh, J.W. Chung, Applied Physics AApril 2008, Volume 91, Issue 1, pp 53-57

  72. Luminescent Properties of Ca-α-SiAlON:Eu2+Phosphors Synthesized by Gas-Pressured Sintering, Jeong Ho Ryua, Youn-Gon Park, Hyong Sik Won, Sang Hyun Kim, Hideo Suzuki, Jong Myeon Lee, Chulsoo Yoon, Mihail Nazarov, Do Young Noh and Boris Tsukerblat, J. Electrochem. Soc. 2008 volume 155, issue 4, J99-J104

  73. Structure of the metallic Si(001) surface at high temperatures: Synchrotron x-ray scattering measurements, Yongsam Kim, Cheolho Jeon, S. H. Uhm, C. C. Hwang, N. D. Kim, Osami Sakata, C. Y. Park, J. W. Chung, and D. Y. Noh,* Phys. Rev. B 78, 033303 (2008) [4 pages]


  74. Electron vibrational interaction in 4f 5d optical transitions in Ba, Ca, Sr thiogallates doped with Eu2+ ions, Nazarov, M.; Tsukerblat, B.; Noh, D. Journal of Luminescence, vol. 128, issue 9, pp. 1533-1540

  75. Vibronic coupling parameters and Stokes shift in thiogallate phosphors, Mihail Nazarova, Boris Tsukerblat, Do Young Noh, Journal of Physics and Chemistry of Solids, Volume 69, Issue 10, October 2008, Pages 26052612

  76. Polarization selection rules and optical transitions in terbium activated yttrium tantalate phosphor under x-ray, vacuum-ultraviolet, Nazarov M, Tsukerblat B, Byeon CC, Arellano I, Popovici EJ, Noh do Y. Appl Opt. 2009 Jan 1;48(1):17-21.

  77. Efficient multiphase green phosphor based on strontium thiogallate, Mihail Nazarov, Do Young Noh, Clare Chisu Byeon, and Hyojung Kim, J. Appl. Phys. 105, 073518 (2009) 

  78. The stability of graphene band structures against an external periodic perturbation; Na on Graphene, Choongyu Hwang, Sunyoung Shin, Seon-Myeong Choi, Namdong Kim, Sanghun Uhm, Hyosang Kim, Chan-cuk Hwang, Doyoung Noh, Seung-Hoon Jhi, Jinwook Chung, Phys. Rev. B 79, 115439 (2009)

  79. Coarsening kinetics of a spinodally decomposed vicinal Si(111) surface, Kim Y, Jo MH, Kim TC, Yang CW, Kim JW, Hwang JS, Noh DY, Kim ND, Chung JW. Phys Rev Lett. 17, 156103 (2009)  

  80.  X-ray Reflectivity Study on the Structure and Phase Stability of Mixed Phospholipid Multilayers, H. Y. Jing, D. H. Hong, B. D. Kwak, D. J. Choi, K. Shin, C.-J. Yu , J. W. Kim, D. Y. Noh and Y. S. Seo, Langmuir, 25, 4198(2009)

  81. Effect of electron blocking layer on efficiency droop in InGaN/GaN multiple quantum well light-emitting diodes, Sang-Heon Han, Dong-Yul Lee, Sang-Jun Lee, Chu-Young Cho, Min-Ki Kwon, S. P. Lee, D. Y. Noh, Dong-Joon Kim, Yong Chun Kim, and Seong-Ju Park, Appl. Phys. Lett. 94, 231123 (2009)

  82. Double Activated X-ray and LED Phosphors with Improved Properties, Mihail Nazarov, Do Young Noh, 2009 International Conference on Signal Processing Systems

  83. New highly efficient green phosphor for LEDs, Nazarov Mihail, Tsukerblat Boris, Noh Do Young, IJEMS Vol.16(3) [June 2009]

  84. Surface metallization on Si(001) at elevated temperatures studied by angle-resolved photoemission spectroscopy and near-edge x-ray, Jeon, C.; Hwang, C. C.; Kang, T.-H.; Kim, K.-J.; Kim, B.; Kim, Y.; Noh, D. Y.; Park, C.-Y., Phys. Rev. B, 80, 153306(2009)

  85. Evidence of metallic nature of the surface bands of Au/Si(557), H. S. Kim, S. Y. Shin, S. H. Uhm, C. C. Hwang, D. Y. Noh, and J. W. Chung, Phys. Rev. B 80, 033412 (2009)

  86. Coherent diffraction surface imaging in reflection geometry, Shashidhara Marathe, S. S. Kim, S. N. Kim, Chan Kim, H. C. Kang, P. V. Nickles, and D. Y. Noh, Optics Express, 18, 7253 (2010)

  87. Coherent hard x-ray diffractive imaging of nonisolated objects confined by an aperture, Kim, Sunam; Kim, Chan; Lee, Suyong; Marathe, Shashidhara; Noh, D. Y.; Kang, H. C.; Kim, S. S.; Sandy, A.; Narayanan, S., Phys. Rev. B. 81, 165437(2010)

  88. Luminescence and Raman studies of YNbO4 phosphors doped by Eu3+, Ga3+, and Al3+, Mihail Nazarov, Young Jin Kim, Eun Young Lee, Kyoung-In Min, Mun Seok Jeong, Su Woong Lee, and Do Young Noh, J. Appl. Phys. 107, 103104 (2010)

  89. Cathodoluminescence studies of undoped and (Cum Fe and Co)-doped tin dioxide films deposited by spray pyrolysis, G. Korotcenkov, B. K. Cho, M. Nazarov, Laura Muresan, Do Young Noh, E. V. Kolesnikova, Current Applied Physics 10, 1123 (2010)

  90. Synthesis and characterisation of terbium activated yttrium tantalate phosphor, Elisabeth-Jeanne Popovici, Mihail Nazarov, Laura Muresan, Do Young Noh, Lucian Barbu Tudoran, Ecaterina Bica, Emil Indrea, Journal of Alloys and Compounds. 497, 201 (2010)

  91. Luminescence and structural properties of Y(Ta,Nb)O4:Eu3+,Tb3+ phosphors, Ivan Arellano, Mihail Nazarov, Clare Chisu Byeon, Elisabeth-Jeanne Popovici, Hyojung Kim, Hyon Chol Kang, Do Young Noh, Materials Chemistry and Physics 01/2010; 119:48-51.

  92. Studies on terbium activated yttrium based tantalate phosphors, Elisabeth-Jeanne Popovici, Mihail Nazarov, Laura Muresan, Do Young Noh, Marius Morar, Ecaterina Bica, Emil Indrea, Radiation Measurements. 45, 300 (2010)

  93. Observation of the Talbot effect using broadband hard x-ray beam, Jae Myung Kim, In Hwa Cho, Su Yong Lee, Hyon Chol Kang, Ray Conley, Chian Liu, Albert T. Macrander, and Do Young Noh, Optics Express, 18, 24975 (2010)

  94.  Rare earth double activated phosphors for different applications, Mihail Nazarov, Do Young Noh, Journal of Rare Earths. 28, 1 (2010)

XLNP Department of Physics and Photon Science , GIST , 123 Cheomdan-gwagiro(Oryong-dong), Buk-ku, Gwangju, 500-712 Republic of Korea Tel : +82-062-715-2352 Dasan building 606

Designed by J.M.Kim and D.H.Kang / X-ray Laboratory for Nano-scale Phenomena

sketchbook5, 스케치북5

sketchbook5, 스케치북5

나눔글꼴 설치 안내

이 PC에는 나눔글꼴이 설치되어 있지 않습니다.

이 사이트를 나눔글꼴로 보기 위해서는
나눔글꼴을 설치해야 합니다.

설치 취소